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[Data] Contracted Analysis Service Reliability Evaluation

Acquisition of ISO/IEC 17025 laboratory accreditation! Reliable testing services through a controlled environment and established procedures.

This document provides a detailed explanation of the "Contract Analysis Service Reliability Evaluation" conducted by Toshiba Nanoanalysis Corporation. It richly introduces various tests, such as temperature cycle tests for electronic components to confirm resistance against thermal stress caused by temperature changes, and X-ray irradiation tests to evaluate the effects and resistance of materials. Please feel free to consult us when you need our services. 【Contents】 ■ Reliability Testing ■ Temperature Cycle Testing for Electronic Components ■ Observation of Aging Degradation through Temperature Cycle Testing ■ Observation of Aging Degradation through Thermal Shock Testing ■ X-ray Irradiation Testing ■ Solder Heat Resistance Testing for Surface Mount Components ■ Bond Strength Testing for Semiconductor Packages *For more details, please refer to the PDF document or feel free to contact us.

• Company：東芝ナノアナリシス
• Price：Other

• Other measuring instruments
• Other analytical equipment
• Non-destructive testing